微博
加入微博一起分享新鲜事
登录
|
注册
140
Statistical analysis of recombination properties of the boron-oxygen defect in p-type Czochralski silicon https://journal.hep.com.cn/fie/EN/10.1007/s11708-016-0442-6
请登录并选择要私信的好友
300
Statistical analysis of recombination properties of the boron-oxygen defect in p-type Czochralski silicon https://journal.hep.com.cn/fie/EN/10.1007/s11708-016-0442-6
赞一下这个内容
公开
分享
获取分享按钮
正在发布微博，请稍候