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Complementary Characterization of Polycrystalline Copper-Nitride Films by UV-MIR (0.2-40 $μ$m) Ellipsometry and FIB-SEM Microscopy https://3dim.optics.arizona.edu/publication/marquez-2023-complementary/
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Complementary Characterization of Polycrystalline Copper-Nitride Films by UV-MIR (0.2-40 $μ$m) Ellipsometry and FIB-SEM Microscopy https://3dim.optics.arizona.edu/publication/marquez-2023-complementary/
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