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Refractive index determination of SiO2 layer in the UV/Vis/NIR range: spectrophotometric reverse engineering on single and bi-layer designs https://doi.org/10.2971/jeos.2013.13010
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Refractive index determination of SiO2 layer in the UV/Vis/NIR range: spectrophotometric reverse engineering on single and bi-layer designs https://doi.org/10.2971/jeos.2013.13010
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