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A self-consistent hybrid model connects empirical and optical models for fast, non-destructive inline characterization of thin, porous silicon layers https://doi.org/10.1051/epjpv/2022035
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A self-consistent hybrid model connects empirical and optical models for fast, non-destructive inline characterization of thin, porous silicon layers https://doi.org/10.1051/epjpv/2022035
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